Wafer And Spatial

Wafer map modes

The wafer map is no longer only a bin view. Current alpha workflows include:

• hard bin
• soft bin
• pass/fail
• parametric heat map for a selected test

The parametric mode is there to answer the common follow-up question: “show me the value on the wafer, not just where it failed.”

When to use parametric mode

Use it when you are looking for:

• center-to-edge drift
• quadrant asymmetry
• radial bands
• reticle or chuck signatures
• hotspot structure before it becomes pure yield loss

Spatial analysis card

The spatial card turns wafer patterns into selection controls.

You can select:

• edge vs core
• radial bands
• quadrants
• hotspots
• selected wafer or lot-stack scope

Those pushes should flow through the shared selection state instead of acting like isolated summaries.

Best practice

Start with the wafer map if you suspect process structure.

Then:

1. confirm the pattern in spatial analysis
2. push the region as a selection
3. inspect that same population in histogram or scatter

That is the shortest path from “interesting picture” to “actionable subset.”