Quickstart
1. Open a lot
Section titled “1. Open a lot”Open Analyze, choose New analysis, and select a lot. Use the latest snapshot unless you want to look at an earlier ingest.
You can read the Cpk table as soon as it appears, while the rest of the lot loads.
Need to upload a lot first? See Upload And Snapshots.
2. Look at a test
Section titled “2. Look at a test”Choose a test in the Cpk table, then expand the scatter or histogram to look more closely. The wafer map shows where dies pass or fail.
Try switching between tests or wafers to see how the results change.
3. Select some dies
Section titled “3. Select some dies”Once the lot data is ready, hold Shift and drag across a chart or wafer map.
The selected dies are highlighted in the other linked views too.
Use the Selected count button in the Cpk table to calculate statistics for those dies. Choose Full lot to return to the lot-wide results.
Shift + drag adds more dies. Alt + Shift + drag replaces the selection.
Click the selected-count button in the selection toolbar to clear it.
4. Save your work
Section titled “4. Save your work”Give the analysis a title and choose Create Analysis. Use Save for later versions. Your snapshot, test, wafer, selection, and what-if limits are saved with it.
See Saved Work And Sharing to reopen a version or share it with someone.
Try next
Section titled “Try next”- What-If Limits: try different limits and review their effect on lot yield.
- SQL Scope: query the lot or your selected dies.
- Analyze Workflow: learn the other controls and loading states.