Why Stratum

Product fit

Stratum is focused on a specific workflow:

load STDF lot data
isolate the population that matters
evaluate a limit change with exact impact
save the result as an analysis or proposal

When `stdf.io` is enough

Use stdf.io when you want:

fast local inspection in the browser
single-user exploration
no saved server-side history

stdf.io is the simpler option for quick local inspection.

When Stratum makes sense

Use Stratum when the analysis has to persist past one engineer and one session.

Stratum fits when you need:

uploaded lots and snapshots on a server
linked scatter, histogram, wafer, and spatial investigation
exact what-if limit review with overlap-safe yield deltas
versioned analyses, proposals, notebooks, read-only shares, and controlled artifacts
SQL work on the same selected dies and active limit scope

What exists today

The current alpha includes:

server-side lot ingest with snapshots
linked analysis surfaces for parametric investigation
what-if review with exact net yield impact
analysis, proposal, and notebook lineage with controlled/read-only flows
built-in alert rules and alert incidents evaluated after ingest
explicit space access plus read-only share links

Current alpha scope

This is a focused alpha. It does not cover a full yield-operations stack.

Not yet available:

automated test-house ingestion
multi-channel notifications (Slack, PagerDuty)
public compliance artifacts (SOC reports)
supply-chain traceability across probe, package, final test, and reliability

Architecture direction

STDF wafer-sort data is the supported analytical domain today. Future WAT/PCM, metrology, inspection, final-test, and equipment-stream domains will be designed from representative customer fixtures rather than forced into a hypothetical universal measurement table.

The practical decision

If your problem is quick one-off local inspection, use stdf.io.

If your problem is getting from lot data to a saved and reviewable decision, use Stratum.