- Linked views that preserve selection and wafer context
- Dense analysis surfaces shaped for actual yield/debug work
- Wafer overlays that show both spatial signatures and raw parametric structure
- Capability ranking and spatial diagnosis in the same workflow
- Clear path from investigation to reviewable notebook artifact
Product gallery
Real alpha screenshots, not concept art.
These screenshots show the current Stratum analysis surface: linked scatter, histogram, CPK, and spatial workflows that feed into a what-if and notebook-driven review process.
Linked analysis
Scatter
Use dense scatter plots to isolate failing populations, drag limits, and keep wafer and selection context intact across the rest of the analysis loop.
Distribution review
Histogram
Check whether the issue is broad distribution drift or a narrower subset before deciding whether the spec, the population, or the test itself is the real problem.
Decision queue
CPK table
Rank the tests that matter most, review capability and fail context, and use the notebook workflow to turn that ranking into a reviewed proposal.
Spatial diagnosis
Spatial
Spot edge-driven signatures, radial bias, and hotspots quickly enough to decide whether you are looking at process behavior, setup drift, or an isolated outlier.
Wafer overlay
Parametric wafer
Switch from bin view to parametric wafer heat mapping to see whether the lot is drifting systematically before the failures become obvious in pure pass/fail views.
Next step
Use the visuals as the anchor, then go deeper in the docs.
The gallery shows the current alpha surface. The docs explain the workflow, limits, and notebook/share model behind it.